Waveform Quality Measurement Description

Waveform Quality Measurement Description

Last updated: January 16, 2009

How is a Waveform Quality Measurement Made?

3GPP TS 34.121 s5.13 states "The Error Vector Magnitude is a measure of the difference between the reference waveform and the measured waveform. This difference is called the error vector. Both waveforms pass through a matched Root Raised Cosine filter with bandwidth 3,84 MHz and roll-off a = 0,22. Both waveforms are then further modified by selecting the frequency, absolute phase, absolute amplitude and chip clock timing so as to minimise the error vector. The EVM result is defined as the square root of the ratio of the mean error vector power to the mean reference power expressed as a %."

The waveform quality measurement in the test set compares the received signal's IQ modulation characteristics to an ideal signal, as defined in 3GPP TS 34.121 s5.13 and annex B.

Measurement Interval in Non-HSDPA Mode

When on a non-HSDPA connection, you must set Trigger Source to any value other than HS-DPCCH . When operating in this mode, the measurement is made during one timeslot (666.7 us). You can choose in which timeslot of the W-CDMA frame the measurement is performed using the Timeslot setting. You can also choose whether to include or exclude the 25 us transient periods on the slot boundaries using the Transient Period setting.

Measurement Interval Duration and Placement for Non-HSDPA

Measurement Interval in HSDPA Mode

This section is only applicable to the lab application or feature-licensed test application .

To measure waveform quality on an HSDPA connection, you must set Trigger Source to HS-DPCCH . When Trigger Source is set to HS-DPCCH, you can specify the measurement interval and its placement within any of the 6 HSDPA subframes.

  1. Use the HS-DPCCH Trigger Subframe Alignment setting to choose in which 2 ms subframe (0 to 5) you want to place the measurement interval.
  2. Use the HS-DPCCH Trigger Slot Alignment setting to specify in which slot within the subframe you want to place the measurement interval ( AckNack = the first slot of the subframe, CQI1 = the second slot of the subframe and CQI2 = the third slot of the subframe).
  3. Set the duration of the measurement interval using the HS-DPCCH Measurement Interval setting. Note that the sum of HS-DPCCH Trigger Subslot Alignment and HS-DPCCH Measurement Interval cannot exceed 1.0 slot.
  4. Use the HS-DPCCH Trigger Subslot Alignment setting to specify where you want to place the measurement interval within the slot. You can place the measurement interval at the slot boundary, 0.1 slot (66.7 us) after the slot boundary, 0.2 slot (133.3 us) after the slot boundary... up to 0.5 slot (333.3 us) after the slot boundary. Note, however, that the sum of HS-DPCCH Trigger Subslot Alignment and HS-DPCCH Measurement Interval cannot exceed 1.0 slot. If you wish to place the measurement interval after the slot boundary using the HS-DPCCH Trigger Subslot Alignment setting, you must first decrease the HS-DPCCH Measurement Interval setting appropriately.
  5. You can choose to shorten the measurement interval so as to exclude the 25 us (96 chip) transient periods at the start and end of the measurement interval using the Transient Period setting. For example, if you set HS-DPCCH Measurement Interval to 0.5 slot (333.3 us or 1280 chips) and set Transient Period to Exclude , the measurement is performed over 283.3 us (or 1088 chips).

Measurement Interval Duration and Placement for HSDPA

Waveform Quality Measurement Parameters

HSDPA Measurement Parameters

This section is only applicable to the lab application or feature-licensed test application .

These settings are only applicable when Trigger Source = HS-DPCCH .

See Measurement Interval in HSDPA Mode for more information about using these parameters to specify the duration and placement of the measurement interval.

Waveform Quality Measurement Results

Waveform Quality Input Signal Requirements

Waveform Quality Measurement Calibration

This measurement should be calibrated using the Calibrate Measurements function ( CALibration:MEASurements? ) when the temperature has changed by ± 10° C or more since the last calibration. If this situation exists, the integrity indicator value becomes 19 and a message is displayed indicating "Uncalibrated Due to Temperature".

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