# PAM Overshoot

Meas. mode:

Eye

Package License:

L-RND

L-MFG

Waveform type:

PAM4

The Eye mode IEEE 802.3cu compatible PAM Overshoot measurement returns a value expressed as a percentage and is defined as:

Where:

**P**is based on a 1e-2_{max}*hit ratio*, where P_{max}is the smallest power level that results in the number of samples above that level not exceeding the product of hit ratio and total number of observed samples. All samples are acquired in a single unit interval eye diagram.**P**is the power of the level three of the PAM4 waveform._{3}

The *hit ratio's* default setting is 1e-2 and is based on the IEEE 802.3cu standard. However, after selecting the measurement you can change this ratio if needed.

## To measure

- Select Eye/Mask Mode.
- Click
**Auto Scale**in the menu toolbar. - Click the toolbar's
**PAM**tab. - On the toolbar, locate and click the
**PAM Overshoot**button.

## SCPI Command

`:MEASure:EYE:PAM:OVERshoot`